1. Disc Drive industries (MR & GMR Head)
2. Semi - Conductor industries
3. Areo - Space industries

OUTGASSING – Three samples of Spiral Coil were used and placed in an outgassing vessel at 85 Degree C. It was then flushed continually for three hours at 50ml/min with grade 5 nitrogen. A carbotrap ‘B’ / carbotrap ‘C’ tube were then used to trap the outgassing constituents after which analyzing using GC/MS with ATD.

FTIR / SILICONE OIL / HYDROCARBONS – The presence of silicone oil and hydrocarbons were extracted in solvent soluble residue from one piece of 15.5 “ of ESD Bluish Spiral Coil. Both the inner and outer surfaces, a total of 121cm square, were rinsed with 10ml of hexane and isopropanol by mixing a portion of 1 : 1 (v/v) of the solvent solution. A clean 30ml glass beaker was used to collect the rinsate. The solvent solution was evaporated to dryness. Thereafter, FTIR / HATR was used to analyze for the presence of silicone oil and hydrocarbons on any residue rinsed from the sample.

IONIC CONTAMINATION – A ESD Bluish Spiral Coil sample were divided into three sections to test for ionic contamination. Three pre-clean glass beaker containing 10ml of de-ionized water was given one section of the spiral coil sample each and then capped off to prevent evaporation. The glass beakers were then placed in an 80 Degree C oven. The water extract was then analyzed using ion chromatography. A hand measured apparent surface area of 10.2cm square was used to calculate the results. 

OUTGASSING - Below are the data obtained from using the following chemical

FTIR / SILICONE OIL / HYDROCARBONS
- Below shown was obtain from the analyzed result on one section of the Spiral Coil.

Note: Result for both the silicone oil and hydrocarbons are in nanograms/cm square surface area.

IONIC CONTAMINTAION - The result tested as follows

ROHS FOR SPIRAL COIL - On analysis, the following result were obtain:

1. Sample was prepared as in AC/ROHS/0006 Ver1.0/05 and all the methods listed above are reference to the IEC 111/24/CD/Ed.1- Procedure for determination of levels of regulated Substances in Electrotechnical Products.
2. CVAAS = Cold Vapour Atomic Absorption  Spectrometry
   ICP – AES = Inductively- Coupled Plasma – Atomic Emission Spectrometry
   GC-MS = Gas Chromatography – Mass Spectrometry 
3. The Method detection limits(MDL) for Lead, Cadmium, Polybrominated Biphenyls and Polybrominated Diphenyl Ethers = 1 ppm each
4. The Method detection limits(MDL) for Hexavalent Chromium = 2ppm
5. The Method detection limits(MDL) for Mercury = 0.5ppm
6. “ND” = Not detected (Less than or equal to 5ppm)